The Yield Learning Report - Connecting design, test and fab

|  IN THIS ISSUE  |

Executive Briefing: Big Iron to EDA: How LogicVision's Jim Healy stays ahead of industry technology trends

Strategically Speaking: Active Filtering: Making sense of the growing number of DFM and DFY solutions.

Technical Paper: Unified Embedded Test: LogicVision's LV2000 solves the problems of testing SoCs.

In the Media: Recent articles of interest to the IC test and yield learning communities.

Products to Watch: YieldInsight and ScanBurst are two new products from LogicVision that will make it easier to ramp yield and execute DFT.

15 Minutes of Fame

 

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IC Test and Yield Learning Report is produced by LogicVision Inc. and its technology partners to promote a better understanding of the relationship between design, test and manufacturability. We welcome comments and contributions from the yield learning community. Editorial services are provided by e-ContentWorks Inc.

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