:: Archives
Briefing: Fabs have design-for-yield information but design engineers can't use it.
Strategically Speaking: Where does Design-for-Yield (DFY) fit into the EDA landscape?
Tech Paper: Requirements for true DFY and DFM from Magma's perspective.
Conference Preview: Requirements for true DFY and DFM from Magma's perspective.
EDA Cafe Interview: Yield analysis automation takes a big step forward.
Briefing: Correct by construction: Yield enhancement for the 21st century.
Strategically Speaking: How process complexity will change the IC industry's business models.
Tech Paper: Lithography-aware design enables 'extreme' RET.
Design for Manufacturing: DFM for advanced technology nodes: Fabless view.
Test Topics: When probing goes in the chip.
Briefing: Physically-aware DFT adds a new dimension to IC yield learning.
Strategically Speaking: Modeling process technology for better yields.
Tech Paper: Reducing Leakage-Induced Field Returns.
Design for Manufacturing: Yield challenges require new DFM approach.
Test Topics: How were you planning to verify all that DFT?
Briefing: The great yield balancing act. ARM Ltd. speaks out.
Strategically Speaking: When do "good" design practices make bad chips?
Test Topics: How do you test 200 IC designs a year and still meet yield and performance goals?
Rules vs. Models: DFM and DFY are not as synonymous has one might think.
Data Dump: How to tame the data intensive characterization dragon.
Briefing: ATPG compression has been around for awhile but its inner workings are still not well understood, and that has led to confusion.
Tech Paper: Why have yields fallen so dramatically at the 90nm and what can design and test teams do to fix it?
ViewPoint: An unprecedented level of industry cooperation is required between design, test and manufacturing to bridge the yield gap.
Ask the Apps Engineer: The pros, cons and tradeoffs of dealing with AWT and SWT memories when using LogicVision tools.
Test Topics: Al Crouch of Inovys provides insight into the dos and don'ts of scan chain testing in this article from Electronic Device Failure Analysis magazine.
DAC Preview: Yield and DFM are making waves - or are they?
Briefing: Five things every CTO should know about yield
Survey Says: It's still too early to develop DFM standards
Tactics: DFT Testers -- Does any low cost tester qualify?
ViewPoint: Jim Healy, CEO of LogicVision, sees a tipping point for yield management on the near horizon.