The Yield Learning Report - Connecting design, test and fab

|  IN THIS ISSUE  |

Executive Briefing: Big Iron to EDA: How LogicVision's Jim Healy stays ahead of industry technology trends

Strategically Speaking: Active Filtering: Making sense of the growing number of DFM and DFY solutions.

Technical Paper: Unified Embedded Test: LogicVision's LV2000 solves the problems of testing SoCs.

In the Media: Recent articles of interest to the IC test and yield learning communities.

Products to Watch: YieldInsight and ScanBurst are two new products from LogicVision that will make it easier to ramp yield and execute DFT.

15 Minutes of Fame

 

:: 15 Minutes of Fame

The Yield Learning Report publishes new articles and links to previously published articles and white papers of general interest to the yield management community.

If you would like to contribute an article, be interviewed for an article in Q&A format for our Strategically Speaking section, or suggest a valuable article or white paper we can link to, just email our editor, Jack Shandle.