The Yield Learning Report - Connecting design, test and fab

|  IN THIS ISSUE  |

Executive Briefing: Fabs have design-for-yield information but design engineers can't use it.

Strategically Speaking: Where does Design-for-Yield (DFY) fit into the EDA landscape?

White Paper: Requirements for true DFY and DFM from Magma's perspective.

Conference Preview: Requirements for true DFY and DFM from Magma's perspective.

EDA Cafe Interview: Yield analysis automation takes a big step forward.

Magma adds Blast Yield TX to its DFM product line

TSMC and Magma cooperate on integrating TSMC's CMP, CAA. and LPC into the Blast Fusion flow.

Blast Yield TX

New ETCompression software offers at-speed test deterministic test

LogicVision announced the industry's first true at-speed deterministic test solution. ETCompression offers the ability to test chips at-speed, under conditions which simulate actual functional operation, and does so with substantial test time and test data volume reductions. The result is an unmatched level of coverage and quality, at a lower test cost.

Read more about ETCompression

Stratosphere Solutions launches StratoPro

StratoPro characterizes process variability using high-resolution measurements derived from unique silicon IP.

Stratosphere Solutions news release

15 Minutes of Fame

 

:: White paper: Requirements for true DFM and DFY

Both DFM and DFY try to overcome the same problem: Designing chips that can be physically manufactured and work as planned. But what is the difference and what does each bring to the party?

This white paper from Magma Design Automation's Web site explains why there are DFM/DFY problems with the current 90-nm and 65-nm technology nodes, why these problems will become even more significant with future nodes, and why legacy design tools and flows are simply not equipped to address these issues.

Requirements for true DFM and DFY