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and that has led to confusion.
A Complete Design Solution for Structured ASICS
:: Talk About Yield
Test Topics: Debugging and Diagnosing Scan Chains
Although scan chains are a powerful testing technique, Murphy's Law is - as always - in effect in IC testing. Scan chains can be broken in three basic ways: By scan-chain sample problems, scan operation control (scan enable) problems, or scan chain shift problems. Sometimes test engineers simply give up and try functional testing.
But an article originally published in Electronic Device Failure Analysis magazine shows how most scan chain problems can be easily debugged and diagnosed so that the can be fixed or at the very least provide valuable information. To read the article, click the link below.
